JPH0312784B2 - - Google Patents
Info
- Publication number
- JPH0312784B2 JPH0312784B2 JP58195400A JP19540083A JPH0312784B2 JP H0312784 B2 JPH0312784 B2 JP H0312784B2 JP 58195400 A JP58195400 A JP 58195400A JP 19540083 A JP19540083 A JP 19540083A JP H0312784 B2 JPH0312784 B2 JP H0312784B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- integrated circuit
- effect transistor
- field effect
- insulated gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
- H03K19/00315—Modifications for increasing the reliability for protection in field-effect transistor circuits
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US43558682A | 1982-10-20 | 1982-10-20 | |
US435586 | 1995-05-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59107559A JPS59107559A (ja) | 1984-06-21 |
JPH0312784B2 true JPH0312784B2 (en]) | 1991-02-21 |
Family
ID=23728983
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58195400A Granted JPS59107559A (ja) | 1982-10-20 | 1983-10-20 | 集積回路 |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0106417B1 (en]) |
JP (1) | JPS59107559A (en]) |
DE (1) | DE3378807D1 (en]) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0161983B1 (en) * | 1984-05-03 | 1992-07-01 | Digital Equipment Corporation | Input protection arrangement for vlsi integrated circuit devices |
JPS60246665A (ja) * | 1984-05-22 | 1985-12-06 | Nec Corp | 入力保護装置 |
KR950007572B1 (ko) * | 1992-03-31 | 1995-07-12 | 삼성전자주식회사 | Esd 보호장치 |
EP0623958B1 (de) * | 1993-05-04 | 1998-04-01 | Siemens Aktiengesellschaft | Integrierte Halbleiterschaltung mit einem Schutzmittel |
JP3283736B2 (ja) * | 1995-09-30 | 2002-05-20 | 日本電気株式会社 | 半導体集積回路装置 |
CN108269858B (zh) * | 2017-01-04 | 2021-07-16 | 深圳尚阳通科技有限公司 | 一种超级结器件、芯片及其制造方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6048106B2 (ja) * | 1979-12-24 | 1985-10-25 | 富士通株式会社 | 半導体集積回路 |
US4342045A (en) * | 1980-04-28 | 1982-07-27 | Advanced Micro Devices, Inc. | Input protection device for integrated circuits |
JPS5780774A (en) * | 1980-11-07 | 1982-05-20 | Hitachi Ltd | Semiconductor integrated circuit device |
-
1983
- 1983-10-19 DE DE8383201486T patent/DE3378807D1/de not_active Expired
- 1983-10-19 EP EP83201486A patent/EP0106417B1/en not_active Expired
- 1983-10-20 JP JP58195400A patent/JPS59107559A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
EP0106417A2 (en) | 1984-04-25 |
EP0106417A3 (en) | 1985-10-30 |
EP0106417B1 (en) | 1988-12-28 |
DE3378807D1 (en) | 1989-02-02 |
JPS59107559A (ja) | 1984-06-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4786956A (en) | Input protection device for integrated circuits | |
US5517051A (en) | Silicon controlled rectifier structure for electrostatic discharge protection | |
US5907462A (en) | Gate coupled SCR for ESD protection circuits | |
KR930010827B1 (ko) | 반도체장치 | |
US6399990B1 (en) | Isolated well ESD device | |
US5682047A (en) | Input-output (I/O) structure with capacitively triggered thyristor for electrostatic discharge (ESD) protection | |
KR100282760B1 (ko) | 정전기적 방전 방지용 회로 및 구조 | |
EP0055552B1 (en) | Input protection circuit for an mis transistor | |
US6072682A (en) | Protection circuit for an electric supply line in a semiconductor integrated device | |
US5925922A (en) | Depletion controlled isolation stage | |
US6861711B2 (en) | Thick gate oxide transistor and electrostatic discharge protection utilizing thick gate oxide transistors | |
US5701024A (en) | Electrostatic discharge (ESD) protection structure for high voltage pins | |
EP0782192A1 (en) | Electrostatic discharge structure of semiconductor device | |
US4609931A (en) | Input protection MOS semiconductor device with zener breakdown mechanism | |
KR100301411B1 (ko) | 반도체 장치 | |
JPH01168064A (ja) | 静電放電に対する保護がなされた、保護閾値が可変な集積回路 | |
US4481521A (en) | Insulated gate field effect transistor provided with a protective device for a gate insulating film | |
US4656491A (en) | Protection circuit utilizing distributed transistors and resistors | |
KR20060089673A (ko) | 반도체 집적 회로 디바이스 및 그 제조 방법 | |
US5895958A (en) | Input protection circuit for use in semiconductor device having an improved electrostatic breakdown voltage | |
US7190563B2 (en) | Electrostatic discharge protection in a semiconductor device | |
US5710452A (en) | Semiconductor device having electrostatic breakdown protection circuit | |
KR900004726B1 (ko) | 대규모 집적회로용 보호회로 | |
EP0892436B1 (en) | Electrostatic protection structure for MOS circuits | |
JP3559075B2 (ja) | Cmos技術の集積電子回路用の極性反転保護装置 |